Unified methods for VLSI simulation and test generation

著者

• Cheng, Kwang-Ting
• Agrawal, Vishwani D.

書誌事項

Unified methods for VLSI simulation and test generation

by Kwang-Ting Cheng and Vishwani D. Agrawal

（The Kluwer international series in engineering and computer science, SECS 73 . VLSI, computer architecture and digital signal processing）

Kluwer Academic Publishers, c1989

注記

At head of title: AT & T

Bibliography: p. [113]-143

Includes index

• NII書誌ID(NCID): BA07295788
• ISBN:
  • 0792390253
• LCCN: 89034073
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boston
• ページ数/冊数: xii, 148 p.
• 大きさ: 25 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.39/5
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Design and construction -- Data processing
  • LCSH : Computer-aided design
  • LCSH : Integrated circuits -- Very large scale integration -- Testing
  • LCSH : Integrated circuits -- Very large scale integration -- Computer simulation
• 親書誌ID:
  • BA0004729X