The application of electron microscopy to materials science : proceedings of an International Workshop, held in China, Gauonzhou, August 1988

Bibliographic Information

The application of electron microscopy to materials science : proceedings of an International Workshop, held in China, Gauonzhou, August 1988

editor, K.H. Kuo ; sponsored by The Chinese Academy of Sciences, The International Centre for Theoretical Physics(Trieste)

Sci-Tech Publications, [1989] , Trans tech Publications, [1989]

Available at  / 7 libraries

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Note

Reprinted from Solid State Phenomena, vol.5(1989)

Description and Table of Contents

Description

Solid State Phenomena Vol. 5

Table of Contents

Electron Energy Loss Spectroscopy Localised Valence Energy Loss Spectroscopy in the Scanning Transmission Electron Microscope Analytical Scanning Electron Microscopy for Solid Surface Profile Imaging of Surfaces and Surface Reactions Imaging of Oxygen Atoms in Cuprous Oxide and a New Series of Suboxides of Copper and Nickel Convergent Beam Electron Diffraction Study of Semiconductor Superlattices and High TC Superconducting Oxides Electron Diffraction and Modulated Structures Dynamics of Discommensuration in Commensurate-Incommensurate Phase Transition of Dielectrics and Alloys The Roles of Defects during Phase Transitions in Complex Oxide Crystals High Resolution Electron Microscopic Observation of Fission Tracks in Zircon Electron Diffraction and Microscopy Evidences of Quasicrystals Electron Diffraction and HREM Study on Imperfect Icosahedral Quasicrystals Crystal Structure Analysis of Organic Solid Solutions and Eutectics in the Electron Microscope: Paraffins, Polymers and Lipids

by "Nielsen BookData"

Details

  • NCID
    BA07300797
  • ISBN
    • 3908044014
  • Country Code
    sz
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Leichtenstein,[Leichtenstein?]
  • Pages/Volumes
    209 p.
  • Size
    25 cm
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