5th TC7 Symposium on Intelligent Measurement : Jena, German Democratic Republic, June 10-14, 1986 : proceedings

著者

• TC7 Symposium on Intelligent Measurement
• Kemény, Tamas
• Havrilla, K.
• International Measurement Confederation

書誌事項

5th TC7 Symposium on Intelligent Measurement : Jena, German Democratic Republic, June 10-14, 1986 : proceedings

editors, T. Kemény and K. Havrilla

（IMEKO TC event series, no. 10）

Nova Science Publishers, 1988

タイトル別名

Fifth TC7 Symposium on Intelligent Measurement

Intelligent measurement

注記

At head of title: International Measurement Confederation

Spine title: Intelligent measurement

Includes bibliographies and index

内容説明・目次

内容説明

These papers deal with the impact of microelectronics, precision mechanics and optoelectronics on intelligent measurements. Main fields of application are laboratory, process and manufacturing automation, and medical and technical diagnostics. New demands for education and training are stated. Acidi

「Nielsen BookData」 より

• NII書誌ID(NCID): BA07481341
• ISBN:
  • 094174339X
• LCCN: 88025539
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Commack [NY]
• ページ数/冊数: xiii, 520 p.
• 大きさ: 25 cm
• 分類:
  • LCC : T50
  • DC19 : 681/.2
• 件名:
  • LCSH : Mensuration -- Congresses
  • LCSH : Optical measurements -- Congresses
• 親書誌ID:
  • BA06715618