5th TC7 Symposium on Intelligent Measurement : Jena, German Democratic Republic, June 10-14, 1986 : proceedings
Author(s)
Bibliographic Information
5th TC7 Symposium on Intelligent Measurement : Jena, German Democratic Republic, June 10-14, 1986 : proceedings
（IMEKO TC event series, no. 10）
Nova Science Publishers, 1988
- Other Title
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Fifth TC7 Symposium on Intelligent Measurement
Intelligent measurement
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At head of title: International Measurement Confederation
Spine title: Intelligent measurement
Includes bibliographies and index
Description and Table of Contents
Description
These papers deal with the impact of microelectronics, precision mechanics and optoelectronics on intelligent measurements. Main fields of application are laboratory, process and manufacturing automation, and medical and technical diagnostics. New demands for education and training are stated. Acidi
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