Reliability, test and diagnostics

Author(s)

• Hakim, Edward B.

Bibliographic Information

Reliability, test and diagnostics

[edited by] Edward B. Hakim

（The Artech House materials science library, . Microelectronic reliability ; v. 1）

Artech House, c1989

Note

Includes bibliographies and index

Details

• NCID: BA07497079
• ISBN:
  • 0890062846
• LCCN: 88007814
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Norwood, MA
• Pages/Volumes: xviii, 374 p.
• Size: 24 cm
• Classification:
  • LCC : TK7871.85
  • DC19 : 621.3815/2
• Subject Headings:
  • LCSH : Semiconductors -- Reliability
• Parent Bibliography ID:
  • BA07497137