Physical aspects of electron microscopy and microbeam analysis

Author(s)

• Siegel, Benjamin M.
• Electron Microscopy Society of America
• Beaman, Donald Robert
• Microbeam Analysis Society

Bibliographic Information

Physical aspects of electron microscopy and microbeam analysis

edited by Benjamin M. Siegel and D. R. Beaman

Wiley, 1975

Note

Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973

"A Wiley biomedical-health publication."

Includes bibliographical references and index

Details

• NCID: BA07555186
• ISBN:
  • 0471790206
• LCCN: 74022483
• Country Code: us
• Title Language Code: eng
• Text Language Code: und
• Place of Publication: New York
• Pages/Volumes: xiii, 474 p.
• Size: 26 cm
• Classification:
  • LCC : QH212.E4
  • DC : 535/.3325
• Subject Headings:
  • LCSH : Electron microscope
  • LCSH : Microprobe analysis
  • LCSH : Microchemistry