Physical aspects of electron microscopy and microbeam analysis

著者

    • Siegel, Benjamin M.
    • Electron Microscopy Society of America
    • Beaman, Donald Robert
    • Microbeam Analysis Society

書誌事項

Physical aspects of electron microscopy and microbeam analysis

edited by Benjamin M. Siegel and D. R. Beaman

Wiley, 1975

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注記

Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973

"A Wiley biomedical-health publication."

Includes bibliographical references and index

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