Defect analysis in electron microscopy

Author(s)

• Loretto, M. H.
• Smallman, R. E.

Bibliographic Information

Defect analysis in electron microscopy

M. H. Loretto and R. E. Smallman

Chapman and Hall , Wiley : distributed by Halstead Press, c1975

• pbk

Note

"A Halsted Press book."

Bibliography: p. 131

Includes index

• NCID: BA07577713
• ISBN:
  • 0412137607
  • 0412137704
• LCCN: 75025615
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: London,New York
• Pages/Volumes: ix, 134 p.
• Size: 24 cm
• Classification:
  • LCC : QD921
  • DC : 548/.84
• Subject Headings:
  • LCSH : Crystals -- Defects
  • LCSH : Electron microscopy