Defect analysis in electron microscopy

Bibliographic Information

Defect analysis in electron microscopy

M. H. Loretto and R. E. Smallman

Chapman and Hall , Wiley : distributed by Halstead Press, c1975

  • pbk

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Note

"A Halsted Press book."

Bibliography: p. 131

Includes index

Details
  • NCID
    BA07577713
  • ISBN
    • 0412137607
    • 0412137704
  • LCCN
    75025615
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    London,New York
  • Pages/Volumes
    ix, 134 p.
  • Size
    24 cm
  • Classification
  • Subject Headings
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