Non-destructive testing : proceedings of the 12th World Conference on Non-Destructive Testing, Amsterdam, The Netherlands, April 23-28, 1989

著者

• World Conference on Non-Destructive Testing
• Boogaard, J.
• Dijk, G. M. van

書誌事項

Non-destructive testing : proceedings of the 12th World Conference on Non-Destructive Testing, Amsterdam, The Netherlands, April 23-28, 1989

edited by J. Boogaard and G.M. van Dijk

Elsevier, 1989

• v. 1
• v. 2

注記

Includes bibliographical references

• NII書誌ID(NCID): BA07603788
• ISBN:
  • 044487450X
  • 044487450X
• LCCN: 89154479
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: und
• 出版地: Amsterdam ; New York
• ページ数/冊数: 2 v. (li, 1900 p.)
• 大きさ: 25 cm
• 分類:
  • LCC : TA417.2
  • DC20 : 620.1/127
• 件名:
  • LCSH : Non-destructive testing -- Congresses