{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA07603788.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA07603788#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA07603788.json"},"dc:title":[{"@value":"Non-destructive testing : proceedings of the 12th World Conference on Non-Destructive Testing, Amsterdam, The Netherlands, April 23-28, 1989"}],"dc:creator":"edited by J. Boogaard and G.M. van Dijk","dc:publisher":[{"@value":"Elsevier"}],"dcterms:extent":"2 v. (li, 1900 p.)","cinii:size":"25 cm","dc:language":"und","dc:date":"1989","cinii:ncid":"BA07603788","cinii:ownerCount":"6","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA03800852#entity","@type":"foaf:Person","foaf:name":[{"@value":"World Conference on Non-Destructive Testing"}]},{"@type":"foaf:Person","foaf:name":[{"@value":"Boogaard, J."}]},{"@id":"https://ci.nii.ac.jp/author/DA03800841#entity","@type":"foaf:Person","foaf:name":[{"@value":"Dijk, G. M. van"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA001299","@type":"foaf:Organization","foaf:name":"室蘭工業大学 附属図書館","rdfs:seeAlso":{"@id":"https://mcatalog.lib.muroran-it.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BA07603788"}},{"@id":"https://ci.nii.ac.jp/library/FA000106","@type":"foaf:Organization","foaf:name":"東京科学大学 大岡山図書館","rdfs:seeAlso":{"@id":"https://topics.libra.titech.ac.jp/recordID/catalog.bib/BA07603788"}},{"@id":"https://ci.nii.ac.jp/library/FA002316","@type":"foaf:Organization","foaf:name":"信州大学 附属図書館 工学部図書館","rdfs:seeAlso":{"@id":"https://www-lib.shinshu-u.ac.jp/opc/recordID/catalog.bib/BA07603788"}},{"@id":"https://ci.nii.ac.jp/library/FA004876","@type":"foaf:Organization","foaf:name":"千葉工業大学 附属図書館","rdfs:seeAlso":{"@id":"https://opac2.lib.chibatech.ac.jp/"}},{"@id":"https://ci.nii.ac.jp/library/FA005358","@type":"foaf:Organization","foaf:name":"上智大学 図書館","rdfs:seeAlso":{"@id":"https://www.lib.sophia.ac.jp/opac/opac_openurl?ncid=BA07603788"}},{"@id":"https://ci.nii.ac.jp/library/FA007852","@type":"foaf:Organization","foaf:name":"大阪産業大学 綜合図書館","rdfs:seeAlso":{"@id":"https://library.cnt.osaka-sandai.ac.jp/gate?module=search&path=search&method=search&searchForm.library=true&searchForm.orderNumber=BA07603788"}}],"bibo:lccn":["89154479"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/89154479"}],"prism:publicationDate":["1989"],"cinii:note":["Includes bibliographical references"],"dc:subject":["LCC:TA417.2","DC20:620.1/127"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Non-destructive+testing+--+Congresses","dc:title":"Non-destructive testing -- Congresses"}],"dcterms:hasPart":[{"@id":"urn:isbn:044487450X","dc:title":"v. 1"},{"@id":"urn:isbn:044487450X","dc:title":"v. 2"}]}]}