{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA07667554.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA07667554#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA07667554.json"},"dc:title":[{"@value":"ICMTS 1989 : Proceedings of the 1989 International Conference on Microelectronic Test Structures, Edinburgh - Scotland, 13-14th March 1989"}],"dcterms:alternative":["1989 IEEE International Conference on Microelectronic Test Structures","89CH26930"],"dc:publisher":[{"@value":"Institute of Electrical and Electronics Engineers, c1989"}],"dcterms:extent":"xii, 265 p.","cinii:size":"30 cm","dc:language":"eng","dc:date":"1989","cinii:ncid":"BA07667554","cinii:ownerCount":"3","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA03840992#entity","@type":"foaf:Person","foaf:name":[{"@value":"IEEE International Conference on Microelectronic Test Structures"}]},{"@id":"https://ci.nii.ac.jp/author/DA01257512#entity","@type":"foaf:Person","foaf:name":[{"@value":"IEEE Electron Devices Society"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA000106","@type":"foaf:Organization","foaf:name":"東京科学大学 大岡山図書館","rdfs:seeAlso":{"@id":"https://topics.libra.titech.ac.jp/recordID/catalog.bib/BA07667554"}},{"@id":"https://ci.nii.ac.jp/library/FA005358","@type":"foaf:Organization","foaf:name":"上智大学 図書館","rdfs:seeAlso":{"@id":"https://www.lib.sophia.ac.jp/opac/opac_openurl?ncid=BA07667554"}},{"@id":"https://ci.nii.ac.jp/library/FA006339","@type":"foaf:Organization","foaf:name":"日本大学 工学部図書館","rdfs:seeAlso":{"@id":"https://celib.nihon-u.ac.jp/opac/opac_openurl/?ncid=BA07667554"}}],"bibo:lccn":["88084125"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/88084125"}],"prism:publicationDate":[null],"cinii:note":["Sponsored by the IEEE Electron Devices Society","Includes bibliographies","IEEE Catalog Number 89CH2693-0"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Integrated+circuits+--+Testing+--+Congresses","dc:title":"Integrated circuits -- Testing -- Congresses"}],"dcterms:hasPart":[{"@id":"urn:isbn:0879427140"}]}]}