{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA07681384.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA07681384#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA07681384.json"},"dc:title":[{"@value":"Fifth annual IEEE Semiconductor Thermal and Temperature Measurement Symposium : February 7-9, 1989, Holiday Inn Embarcadero, San Diego, CA, USA"}],"dcterms:alternative":["5th annual IEEE Semiconductor Thermal and Temperature Measurement Symposium, February 7-9, 1989, San Diego, CA, USA","89CH2688-0","89CH26880"],"dc:creator":"[sponsored by IEEE Components, Hybrids, and Manufacturing Technology Society]","dc:publisher":[{"@value":"Institute of Electrical and Electronics Engineers"}],"dcterms:extent":"178 p.","cinii:size":"28 cm","dc:language":"eng","dc:date":"1989","cinii:ncid":"BA07681384","cinii:ownerCount":"1","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA03850373#entity","@type":"foaf:Person","foaf:name":[{"@value":"IEEE Semiconductor Thermal and Temperature Measurement Symposium"}]},{"@id":"https://ci.nii.ac.jp/author/DA03215284#entity","@type":"foaf:Person","foaf:name":[{"@value":"IEEE Components, Hybrids, and Manufacturing Technology Society"}]},{"@id":"https://ci.nii.ac.jp/author/DA00739948#entity","@type":"foaf:Person","foaf:name":[{"@value":"Institute of Electrical and Electronics Engineers"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA000106","@type":"foaf:Organization","foaf:name":"東京科学大学 大岡山図書館","rdfs:seeAlso":{"@id":"https://topics.libra.titech.ac.jp/recordID/catalog.bib/BA07681384"}}],"bibo:lccn":["88082630"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/88082630"}],"prism:publicationDate":["c1989"],"cinii:note":["Bibliography: p. 152-172","\"IEEE Catalog Number 89CH2688-0\""]}]}