Proceedings of the 1st European Test Conference, Paris, April 12-14, 1989

Author(s)

• European Test Conference
• Société des électriciens et des électroniciens
• IEEE Computer Society
• Institute of Electrical and Electronics Engineers

Bibliographic Information

Proceedings of the 1st European Test Conference, Paris, April 12-14, 1989

IEEE Computer Society Press, c1989

• : pbk.
• : microfiche
• : hard

Note

"[Sponsored by] Société des électriciens et des électroniciens, IEEE Computer Society [and] the Institute of Electrical and Electronics Engineers, Inc."

"IEEE Computer Society order number 1937."

"IEEE Catalog Number 89CH2696-3"

Includes bibliographies and index

Details

• NCID: BA07686774
• ISBN:
  • 0818619376
  • 0818659378
  • 0818689374
• LCCN: 88084042
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Washington, D.C.
• Pages/Volumes: xiv, 417 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.381/548
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses