Autotestcon '89 Conference Record : "the Systems Readiness Technology Conference" :IEEE International Automatic Testing Conference , September 25-28, 1989, Adams Mark Hotel, City Line Avenue, Philadelphia, Pennsylvania

著者

• Autotestcon
• Institute of Electrical and Electronics Engineers
• IEEE Instrumentation and Measurement Society
• IEEE Aerospace and Electronic Systems Society
• Institute of Electrical and Electronics Engineers. Philadelphia Section
• American Institute of Aeronautics and Astronautics
• AIAA Supprt Systems Technical Committee

書誌事項

Autotestcon '89 Conference Record : "the Systems Readiness Technology Conference" :IEEE International Automatic Testing Conference , September 25-28, 1989, Adams Mark Hotel, City Line Avenue, Philadelphia, Pennsylvania

sponsored by the Institute of Electrical and Electronics Engineers ... [et al.]

Institute of Electrical and Electronics Engineers, c1989

タイトル別名

1989 IEEE Autotestcon

89CH25648

注記

"IEEE Catalog Number: 89CH2568-4"

"Automatic Testing in the Next Decade & the 21st Century"

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA07846065
• LCCN: 88080180
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York, N.Y.
• ページ数/冊数: [22], 357 p.
• 大きさ: 28 cm