Scanning microscopy technologies and applications

Author(s)

• Teague, E. C. (Edgar Clayton)
• Society of Photo-optical Instrumentation Engineers
• American Society for Precision Engineering

Bibliographic Information

Scanning microscopy technologies and applications

E. Clayton Teague, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, American Society for Precision Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 897）

SPIE, c1988

Note

"13-15 January 1988, Los Angeles, California."

Includes bibliographies and index

Details

• NCID: BA0787197X
• ISBN:
  • 0892529326
• LCCN: 88060251
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: viii, 218 p.
• Size: 28 cm
• Classification:
  • LCC : QH212.S3
  • DC19 : 535/.3325
• Subject Headings:
  • LCSH : Scanning electron microscopes -- Congresses
• Parent Bibliography ID:
  • BA0022700X