Semiconductor device reliability

著者

• NATO Advanced Research Workshop on Semiconductor Device Reliability
• Christou, Aris
• Unger, B. A.

書誌事項

Semiconductor device reliability

edited by A. Christou and B.A. Unger

（NATO ASI series, ser. E . Applied sciences ; no. 175）

Kluwer Academic Publishers, c1990

注記

Proceedings of the NATO Advanced Research Workshop on Semiconductor Device Reliability, Heraklio, Crete, Greece, June 4-9, 1989"--T.p. verso

Published in cooperation with NATO Scientific Affairs Division"

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA0790597X
• ISBN:
  • 0792305361
• LCCN: 89024589
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Dordrecht ; Boston
• ページ数/冊数: ix, 575 p.: ill.
• 大きさ: 25 cm
• 分類:
  • LCC : TK7871.85
  • DC20 : 621.381/52
• 件名:
  • LCSH : Semiconductors -- Reliability -- Congresses
• 親書誌ID:
  • BA00020624