AT&T reliability manual

Author(s)

• Klinger, David J.
• Nakada, Yoshinao
• Menendez, Maria A.
• AT & T Bell Laboratories

Bibliographic Information

AT&T reliability manual

edited by David J. Klinger, Yoshinao Nakada, Maria A. Menendez (AT&T Bell Laboratories)

Van Nostrand Reinhold, c1990

Note

Rev. ed. of: Reliability information notebook. 5th ed

Includes bibliographical references

Description and Table of Contents

Description

Partial Contents: Reliability Concepts; Device Reliability; Hazard Rates; Monitoring Reliability; Specific Device Information, and more. Appendixes. 60 illustrations.

by "Nielsen BookData"

Details

• NCID: BA09965881
• ISBN:
  • 0442318480
• LCCN: 89024887
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xi, 225 p.
• Size: 27 cm
• Classification:
  • LCC : TK5103
  • DC20 : 621.382
• Subject Headings:
  • LCSH : Telecommunication -- Apparatus and supplies -- Reliability