Accelerated testing : statistical models, test plans and data analysis

Author(s)

• Nelson, Wayne

Bibliographic Information

Accelerated testing : statistical models, test plans and data analysis

Wayne Nelson

（Wiley series in probability and mathematical statistics, . Applied probability and statistics）

Wiley, c1990

Note

"A Wiley-Interscience publication."

Includes bibliographical references (p. 561-577) and index

Details

• NCID: BA10134812
• ISBN:
  • 0471522775
• LCCN: 89024853
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xiv, 601 p.
• Size: 25 cm
• Classification:
  • LCC : QA276
  • DC20 : 519.5
• Subject Headings:
  • LCSH : Failure time data analysis
  • LCSH : Reliability (Engineering) -- Statistical methods
  • LCSH : Accelerated life testing -- Statistical methods
• Parent Bibliography ID:
  • BA00019013