Accelerated testing : statistical models, test plans and data analysis

書誌事項

Accelerated testing : statistical models, test plans and data analysis

Wayne Nelson

(Wiley series in probability and mathematical statistics, . Applied probability and statistics)

Wiley, c1990

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注記

"A Wiley-Interscience publication."

Includes bibliographical references (p. 561-577) and index

内容説明・目次

内容説明

Many manufacturers invest much time and money in product reliability in order to maximize quality and competitiveness. This book provides practical, modern statistical methods for accelerated testing - a process by which products can be life tested at high stress conditions to yield failures quickly. The author presents accelerated test models, data analyses and test plans.

目次

Models for Life Tests with Constant Stress. Graphical Data Analysis. Complete Data and Least Squares Analyses. Censored Data and Maximum Likelihood Methods. Test Plans. Competing Failure Modes and Size Effect. Least-Squares Comparisons for Complete Data. Maximum Likelihood Comparisons for Censored and Other Data. Models and Data Analyses for Step and Varying Stress. Accelerated Degradation. Appendix. References. Index.

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