ITC : International Test Conference : Meeting the tests of time, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC

著者

• International Test Conference
• IEEE Computer Society. Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section
• Oberly, Raymon

書誌事項

ITC : International Test Conference : Meeting the tests of time, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC

Sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section

IEEE Computer Society Press , Institute of Electrical and Electronics Engineers, c1989

タイトル別名

1989 IEEE International Test Conference

1962 89CH27425 264620X

注記

"IEEE Computer Society Order Number 1962"

"IEEE Catalog Number 89CH2742-5"

"SAN 264-620X"

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA10142876
• ISBN:
  • 0818689625
• LCCN: 89083677
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington, D.C. ; Tokyo,New York, N.Y.
• ページ数/冊数: xxxiv, 959 p.
• 大きさ: 28 cm