ITC : International Test Conference : Meeting the tests of time, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC

Author(s)

• International Test Conference
• IEEE Computer Society. Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section
• Oberly, Raymon

Bibliographic Information

ITC : International Test Conference : Meeting the tests of time, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC

Sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section

IEEE Computer Society Press , Institute of Electrical and Electronics Engineers, c1989

Other Title

1989 IEEE International Test Conference

1962 89CH27425 264620X

Note

"IEEE Computer Society Order Number 1962"

"IEEE Catalog Number 89CH2742-5"

"SAN 264-620X"

Includes bibliographies and index

• NCID: BA10142876
• ISBN:
  • 0818689625
• LCCN: 89083677
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Washington, D.C. ; Tokyo,New York, N.Y.
• Pages/Volumes: xxxiv, 959 p.
• Size: 28 cm