The physics of moire metrology
著者
書誌事項
The physics of moire metrology
（Wiley series in pure and applied optics）
Wiley, 1990
大学図書館所蔵 件 / 全12件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
"A Wiley-Interscience publication."
Bibliography: p. xiii
Includes index
内容説明・目次
内容説明
This is a comprehensive introduction to Moire technology, the physics behind it and its applications to optics. It provides background information on the development of Moire methodology and compares moire analysis with conventional methods on wave properties (such as interferometry). The authors show that for every interferometric technique in metrology there is an analogous one in Moire technology, demonstrating that Moire analysis is a real alternative to interfermonetry and holography.
目次
- Historical background
- introduction to Moire metrology
- techniques used in Moire metrology
- limitations on accuracy due to the use of light
- holographic vs Moire contouring of three-dimensional diffusive objects
- Moire analysis of strain
- Moire deflectometry
- applications of Moire deflectometry.
「Nielsen BookData」 より
