Proceedings : Thirty-eighth Annual Meeting Electron Microscopy Society of America, San Francisco, California, August 4-8, 1980

著者

• Annual Meeting Electron Microscopy Society of America
• Bailey, G. W.
• Electron Microscopy Society of America

書誌事項

Proceedings : Thirty-eighth Annual Meeting Electron Microscopy Society of America, San Francisco, California, August 4-8, 1980

editor, G. W. Bailey

Claitor's Pub. Div., c1980

タイトル別名

Electron Microscopy

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA10174395
• LCCN: 68003947
• 出版国コード: us
• タイトル言語コード: eng
• 出版地: Baton Rouge
• ページ数/冊数: 825 p.
• 大きさ: 27 cm