Scanning electron microscopy 1968 : proceedings of the Symposium on the Scanning Electron Microscope -- the instrument and its applications, held at IIT Research Institute, Chicago, Illnois, USA, April 30-May 1, 1968

著者

• Scanning Electron Microscope Symposium
• IIT Research Institute

書誌事項

Scanning electron microscopy 1968 : proceedings of the Symposium on the Scanning Electron Microscope -- the instrument and its applications, held at IIT Research Institute, Chicago, Illnois, USA, April 30-May 1, 1968

IIT Research Institute, 1968

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA10178738
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Chicago, Illnois
• ページ数/冊数: viii, 185 p.
• 大きさ: 29 cm
• 分類:
  • LCC : QH212.S3
  • DC : 578/.4/5
• 件名:
  • LCSH : Scanning electron microscope -- Congresses