Scanning electron microscopy 1971 : proceedings of the [Part 1: April 27-29, 1971] fourth Annual Scanning Electron Microscope Symposium and [Part 2: April 30, 1971] Workshop on Forensic Applications of the Scanning Electron Microscope, Chicago, Illnois, 1971

Author(s)

• Scanning Electron Microscope Symposium
• Workshop on Forensic Applications of the Scanning Electron Microscope (1971 : Chicago, Illnois)
• Johari, Om
• Corvin, Irene
• IIT Research Institute
• National Institute of Law Enforcement and Criminal Justice

Bibliographic Information

Scanning electron microscopy 1971 : proceedings of the [Part 1: April 27-29, 1971] fourth Annual Scanning Electron Microscope Symposium and [Part 2: April 30, 1971] Workshop on Forensic Applications of the Scanning Electron Microscope, Chicago, Illnois, 1971

edited by Om Johari and Irene Corvin

IIT Research Institute, 1971

Note

Part 1: sponsored by IIT Research Institute

Part 2: sponsored by the National Institute of Law Enforcement and Criminal Justice (LEAA, U.S. Department of Justice), and IIT Research Institute

Includes bibliographical references and index

Details

• NCID: BA10181710
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Chicago, Illnois
• Pages/Volumes: xiv, 618 p.
• Size: 29 cm
• Classification:
  • LCC : QH212.S3
  • DC : 578/.4/5
• Subject Headings:
  • LCSH : Scanning electron microscope -- Congresses