{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA10205058.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA10205058#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA10205058.json"},"dc:title":[{"@value":"Modern electronic instrumentation and measurement techniques"}],"dc:creator":"Albert D. Helfrick, William D. Cooper","dc:publisher":[{"@value":"Prentice Hall"}],"dcterms:extent":"xii, 446 p.","cinii:size":"25 cm","dc:language":"eng","dc:date":"1990","cinii:ncid":"BA10205058","cinii:ownerCount":"7","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA00036981#entity","@type":"foaf:Person","foaf:name":[{"@value":"Helfrick, Albert D."}]},{"@id":"https://ci.nii.ac.jp/author/DA00036970#entity","@type":"foaf:Person","foaf:name":[{"@value":"Cooper, William David"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA001619","@type":"foaf:Organization","foaf:name":"茨城大学 附属図書館 工学部分館","rdfs:seeAlso":{"@id":"http://opac.lib.ibaraki.ac.jp/opc/recordID/catalog.bib/BA10205058"}},{"@id":"https://ci.nii.ac.jp/library/FA002123","@type":"foaf:Organization","foaf:name":"富山大学 附属図書館","rdfs:seeAlso":{"@id":"http://opac.lib.u-toyama.ac.jp/opc/recordID/catalog.bib/BA10205058"}},{"@id":"https://ci.nii.ac.jp/library/FA002848","@type":"foaf:Organization","foaf:name":"大阪大学 附属図書館 総合図書館","rdfs:seeAlso":{"@id":"https://opac.library.osaka-u.ac.jp/opac/opac_openurl/?ncid=BA10205058"}},{"@id":"https://ci.nii.ac.jp/library/FA004311","@type":"foaf:Organization","foaf:name":"北海学園大学 附属図書館","rdfs:seeAlso":{"@id":"https://opac.hgu.jp/gate?module=search&path=search&method=search&searchForm.library=true&searchForm.orderNumber=BA10205058"}},{"@id":"https://ci.nii.ac.jp/library/FA004490","@type":"foaf:Organization","foaf:name":"東北工業大学 附属図書館","rdfs:seeAlso":{"@id":"https://opac.tohtech.ac.jp/opac/search?target=local&searchmode=complex&autoDetail=true&s_ncid=BA10205058"}},{"@id":"https://ci.nii.ac.jp/library/FA007921","@type":"foaf:Organization","foaf:name":"大阪電気通信大学 図書館","rdfs:seeAlso":{"@id":"http://oeculib.osakac.ac.jp/"}},{"@id":"https://ci.nii.ac.jp/library/FA012670","@type":"foaf:Organization","foaf:name":"石巻専修大学 図書館","rdfs:seeAlso":{"@id":"https://opac.lib.senshu-u.ac.jp/iwjs0008isu/ctlsrh.do?ncid=BA10205058"}}],"bibo:lccn":["88034209"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/88034209"}],"prism:publicationDate":["c1990"],"cinii:note":["Rev. ed. of: Electronic instrumentation and measurement techniques / William David Cooper, Albert D. Helfrick. 3rd ed. c1985","Includes bibliographies and index"],"dc:subject":["LCC:TK275","DC19:621.3815/4"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Electric+measurements","dc:title":"Electric measurements"},{"@id":"https://ci.nii.ac.jp/books/search?q=Electric+meters","dc:title":"Electric meters"},{"@id":"https://ci.nii.ac.jp/books/search?q=Electronic+measurements","dc:title":"Electronic measurements"},{"@id":"https://ci.nii.ac.jp/books/search?q=Electronic+instruments","dc:title":"Electronic instruments"}],"dcterms:hasPart":[{"@id":"urn:isbn:0135932947"}]}]}