Automated testing of electro-optical systems, 7-8 April 1988, Orlando, Florida

著者

• Nestler, John
• Richardson, Philip I.
• Society of Photo-optical Instrumentation Engineers

書誌事項

Automated testing of electro-optical systems, 7-8 April 1988, Orlando, Florida

John Nestler, Philip I. Richardson, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 941）

SPIE, c1988

注記

Includes bibliographical references

• NII書誌ID(NCID): BA10253913
• ISBN:
  • 0892529768
• LCCN: 88061021
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: vi, 106 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA1750
  • DC20 : 621.381/045
• 件名:
  • LCSH : Electrooptical devices -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses
• 親書誌ID:
  • BA0022700X