Bibliographic Information

Spectroscopic characterization techniques for semiconductor technology III : 14-15 March 1988, Newport Beach, California

Orest J. Glembocki, Fred H. Pollak, Fernando Ponce, chairs/editors ; sponsored by Optical Society of America, SPIE--the International Society for Optical Engineering ; cooperating organization, the Metallurgical Society

(Proceedings / SPIE -- the International Society for Optical Engineering, v. 946)

The Society, c1988

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Includes bibliographies and index

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    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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