書誌事項

Optical testing and metrology II : 27-30 June 1988, Dearborn, Michigan

C.P. Grover, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering and ESD--the Engineering Society

(Proceedings / SPIE -- the International Society for Optical Engineering, v. 954)

SPIE, c1989

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注記

Includes bibliographies and index

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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