{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA10761936.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA10761936#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA10761936.json"},"dc:title":[{"@value":"Sixth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium : February 6-8, 1990, Sunburst Resort Hotel, Scottsdale, AZ, USA"}],"dcterms:alternative":["6th Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium, February 6-8, 1990, Scottsdale, AZ, USA","90CH2640-1","90CH26401"],"dc:publisher":[{"@value":"Institute of Electrical and Electronics Engineers"}],"dcterms:extent":"xiv, 146 p.","cinii:size":"28 cm","dc:language":"eng","dc:date":"1990","cinii:ncid":"BA10761936","cinii:ownerCount":"1","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA03850373#entity","@type":"foaf:Person","foaf:name":[{"@value":"IEEE Semiconductor Thermal and Temperature Measurement Symposium"}]},{"@id":"https://ci.nii.ac.jp/author/DA00739948#entity","@type":"foaf:Person","foaf:name":[{"@value":"Institute of Electrical and Electronics Engineers"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA000106","@type":"foaf:Organization","foaf:name":"東京科学大学 大岡山図書館","rdfs:seeAlso":{"@id":"https://topics.libra.titech.ac.jp/recordID/catalog.bib/BA10761936"}}],"bibo:lccn":["89084329"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/89084329"}],"prism:publicationDate":["c1990"],"cinii:note":["Bibliography: p. 120-142"]}]}