Digital systems testing and testable design

Author(s)

• Abramovici, Miron
• Breuer, Melvin A.
• Friedman, Arthur D.

Bibliographic Information

Digital systems testing and testable design

Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman

（Electrical engineering communications and signal processing series）

Computer Science Press, c1990

Note

Includes bibliographical references (p. 644-645) and index

Details

• NCID: BA10764209
• ISBN:
  • 0716781794
• LCCN: 89025259
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, NY
• Pages/Volumes: xxi, 653 p.
• Size: 25 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.381/5
• Subject Headings:
  • LCSH : Digital integrated circuits -- Testing
  • LCSH : Digital integrated circuits -- Design and construction
• Parent Bibliography ID:
  • BA00433704