28th Annual Proceedings : Reliability Physics 1990, New Orleans, Louisiana, March 27,28,29, 1990

著者

• IEEE International Reliability and Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

28th Annual Proceedings : Reliability Physics 1990, New Orleans, Louisiana, March 27,28,29, 1990

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers, c1990

タイトル別名

1990 IEEE Annual International Reliability Physics

90CH27870

注記

Includes bibliographies

詳細情報

• NII書誌ID(NCID): BA10862161
• LCCN: 82640313
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: v, 322 p.
• 大きさ: 28 cm