Defects in silicon : proceedings of Symposium B on Science and Technology of Defects in Silicon of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989

著者

• Ammerlaan, C. A. J.
• Chantre, A.
• Wagner, P.
• European Materials Research Society. Meeting

書誌事項

Defects in silicon : proceedings of Symposium B on Science and Technology of Defects in Silicon of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989

edited by C.A.J. Ammerlaan, A. Chantre, P. Wagner

（European Materials Research Society symposia proceedings, v. 9）

North-Holland, 1989

注記

"Reprinted from Materials science & engineering, vol. B4(1/4)"--t.p. verso

詳細情報

• NII書誌ID(NCID): BA10898941
• ISBN:
  • 0444886192
• LCCN: 90162932
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Amsterdam ; New York
• ページ数/冊数: xii, 505 p.
• 大きさ: 27 cm
• 親書誌ID:
  • BA07004036