Defect recognition and image processing in III-V compounds III : proceedings of the Third International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Tokyo, Japan, 22-25 September 1989

Author(s)

• International Symposium on Defect Recognition and Image Processing in III-V Compounds
• Ogawa, T.

Bibliographic Information

Defect recognition and image processing in III-V compounds III : proceedings of the Third International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Tokyo, Japan, 22-25 September 1989

edited by T. Ogawa

（Journal of crystal growth, v. 103, no. 1-4）

North-Holland, 1990

Details

• NCID: BA10947898
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Amsterdam
• Pages/Volumes: xi, 474 p.
• Size: 26 cm
• Classification:
  • LCC : TK7871.85
  • DC19 : 621.3815/2
• Subject Headings:
  • LCSH : Semiconductors -- Defects -- Congresses
  • LCSH : Gallium arsenide -- Congresses
  • LCSH : Image processing -- Congresses
• Parent Bibliography ID:
  • BA07743980