Atom-probe field ion microscopy : field ion emission and surfaces and interfaces at atomic resolution

Bibliographic Information

Atom-probe field ion microscopy : field ion emission and surfaces and interfaces at atomic resolution

Tien T. Tsong

Cambridge University Press, 1990

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Details

  • NCID
    BA10978621
  • ISBN
    • 0521363799
  • Country Code
    uk
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Cambridge
  • Pages/Volumes
    x, 387 p.
  • Size
    24 cm
  • Classification
  • Subject Headings
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