Integrated circuit technology : instrumentation and techniques for measurement, process, and failure analysis

著者

• Schwartz, Seymour

書誌事項

Integrated circuit technology : instrumentation and techniques for measurement, process, and failure analysis

edited by Seymour Schwartz

McGraw-Hill, c1967

注記

Includes bibliographies and index

• NII書誌ID(NCID): BA10989129
• LCCN: 66028633
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xxii, 340 p
• 大きさ: 26 cm
• 分類:
  • LCC : TK7874
  • DC : 621.3817
• 件名:
  • LCSH : Integrated circuits -- Addresses, essays, lectures