Fault diagnosis of digital circuits
Author(s)
Bibliographic Information
Fault diagnosis of digital circuits
Wiley, c1990
- Other Title
-
Kontrolʹ i diagnostika t︠s︡ifrovykh uzlov ĖVM
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Note
Translation of: Kontrolʹ i diagnostika t︠s︡ifrovykh uzlov ĖVM
Bibliography: p. [191]-196
Includes index
Description and Table of Contents
Description
A distinctive feature of the present stage in computer equipment development is the continuous increase in functionality and complexity of computer components. Production procedures and techniques for electronic equipment are constantly improved and its capabilities expand. The use of advanced technologies increases the integration of digital components in computers, and extends their range. The ever-growing complexity of digital components used in computers places more stringent requirements upon their reliability. Reliability may be improved by a complex of technological, maintenance and organizational measures. The technical diagnostic techniques for digital computer component are exceptional. One of the types of diagnosing computer parts and components is on-line testing. Its application at the stage of components manufacturing allows users to determine whether their behaviour is correct and to perform the fault location procedure which eventually improves the basic reliability parameters.
The principal emphasis of the present study is on the use of up-to-date on-line testing techniques for digital devices employed in computers which are popular but have not been adequately covered in literature.
Table of Contents
- Diagnostic testing problems. Test generation - one-dimensional path sensitization
- D-Algorithm
- Boolean differences
- equivalent normal form (ENF)
- estimating test generation efficiency. Details of testable digital circuit design
- design of testable combinational circuits
- scan techniques
- level-sensitive scan design
- practical rule of designing testability to digital circuits
- design of circuits testable by compressed estimation of their responses
- random testing
- pseudorandom testing
- application of pseudorandom sequences to VLSI testing
- signature analysis
- special feature of signature analysis application
- new signature generation techniques for binary sequences
- analysis of multi-output digital circuits.
by "Nielsen BookData"
