2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France

Author(s)

• European Conference on Optics Applied to Metrology
• Grosmann, Michel
• Meyrueis, Patrick
• Optics, Photonics, and Iconics Engineering Meeting
• European Photonics Association
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France

editors, Michel Grosmann, Patrick Meyrueis ; organized by European Photonics Association in collaboration with the Society of Photo-optical Instrumentation Engineers

（Proceedings of the Society of Photo-Optical Instrumentation Engineers, v. 210）

Society of Photo-optical Instrumentation Engineers, c1980

Note

Includes bibliographical references and indexes

• NCID: BA11161515
• ISBN:
  • 0892522380
• LCCN: 80127941
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: x, 228 p.
• Size: 28 cm
• Classification:
  • LCC : TA1522
  • DC19 : 620/.0044
• Subject Headings:
  • LCSH : Optical measurements -- Congresses
  • LCSH : Holographic interferometry -- Congresses
  • LCSH : Speckle metrology -- Congresses
• Parent Bibliography ID:
  • BA0118856X