Protocol test systems : proceedings of the IFIP TC 6 Second International Workshop on Protocol Test Systems, organized by GMD-FOKUS and IBM-ENC, Berlin, F.R.G., 3-6 October 1989

著者

• IFIP TC6 International Workshop on Protocol Test Systems
• Meer, Jan de
• Mackert, Lothar
• Effelsberg, Wolfgang
• International Federation for Information Processing. Technical Committee

書誌事項

Protocol test systems : proceedings of the IFIP TC 6 Second International Workshop on Protocol Test Systems, organized by GMD-FOKUS and IBM-ENC, Berlin, F.R.G., 3-6 October 1989

edited by Jan de Meer, Lothar Mackert, Wolfgang Effelsberg

North-Holland , Distributors for the U.S. and Canada, Elsevier Pub. Co., 1990

注記

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA11181443
• ISBN:
  • 0444885633
• LCCN: 90006869
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Amsterdam ; Tokyo,New York, N.Y.
• ページ数/冊数: x, 371 p.
• 大きさ: 23 cm
• 分類:
  • LCC : TK5105.5
  • DC20 : 621.39/81/0287
• 件名:
  • LCSH : Computer networks protocols -- Testing -- Congresses