Protocol test systems : proceedings of the IFIP TC 6 Second International Workshop on Protocol Test Systems, organized by GMD-FOKUS and IBM-ENC, Berlin, F.R.G., 3-6 October 1989

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Protocol test systems : proceedings of the IFIP TC 6 Second International Workshop on Protocol Test Systems, organized by GMD-FOKUS and IBM-ENC, Berlin, F.R.G., 3-6 October 1989

edited by Jan de Meer, Lothar Mackert, Wolfgang Effelsberg

North-Holland , Distributors for the U.S. and Canada, Elsevier Pub. Co., 1990

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Includes bibliographical references

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