The changing philosophy of test : International Test Conference 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC

著者

• International Test Conference
• IEEE Computer Society. Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

The changing philosophy of test : International Test Conference 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC

sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section

Tokyo : IEEE Computer Society Press, c1990

• : paper
• : microfiche
• : case

タイトル別名

2064 90CH29106 264620X

注記

"Computer Society order number 2064."

"IEEE catalog number 90CH2910-6."

"SAN 264-620X."

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA11598808
• ISBN:
  • 0818620641
  • 0818660643
  • 081869064X
• LCCN: 90055486
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xvi, 1083 p.
• 大きさ: 29 cm