The changing philosophy of test : International Test Conference 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC

Author(s)

• International Test Conference
• IEEE Computer Society. Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

The changing philosophy of test : International Test Conference 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC

sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section

Tokyo : IEEE Computer Society Press, c1990

• : paper
• : microfiche
• : case

Other Title

2064 90CH29106 264620X

Note

"Computer Society order number 2064."

"IEEE catalog number 90CH2910-6."

"SAN 264-620X."

Includes bibliographies and index

Details

• NCID: BA11598808
• ISBN:
  • 0818620641
  • 0818660643
  • 081869064X
• LCCN: 90055486
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xvi, 1083 p.
• Size: 29 cm