Electron microscopy 1990 : proceedings of the 12th International Congress for Electron Microscopy held in Seattle, Washington, USA, 12-18 August 1990 : 48th annual meeting of the Electron Microscopy Society of America and 25th annual meeting of the Microbeam Analysis Society

書誌事項

Electron microscopy 1990 : proceedings of the 12th International Congress for Electron Microscopy held in Seattle, Washington, USA, 12-18 August 1990 : 48th annual meeting of the Electron Microscopy Society of America and 25th annual meeting of the Microbeam Analysis Society

editors. L. D. Peachey, D. B. Williams

San Francisco Press, c1990

  • v. 1
  • v. 2
  • v. 3
  • v. 4

大学図書館所蔵 件 / 7

この図書・雑誌をさがす

収録内容

  • v. 1. Imaging Sciences
  • v. 2. Analytical Sciences
  • v. 3. Biological Sciences
  • V. 4. Materials Sciences

詳細情報

  • NII書誌ID(NCID)
    BA11818868
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    San Francisco
  • ページ数/冊数
    4 v.
  • 大きさ
    26 cm
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