Particle beam microanalysis : fundamentals, methods, and applications

Author(s)

• Fuchs, Ekkehard
• Oppolzer, Helmut
• Rehme, Hans

Bibliographic Information

Particle beam microanalysis : fundamentals, methods, and applications

E. Fuchs, H. Oppolzer, H. Rehme

VCH, c1990

• : gw
• : us

Note

Includes bibliographical references and index

Details

• NCID: BA11878316
• ISBN:
  • 3527268847
  • 0895735059
• LCCN: 90012865
• Country Code: gw
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Weinheim ; New York
• Pages/Volumes: xviii, 507 p.
• Size: 25 cm
• Classification:
  • LCC : TA417.23
  • DC20 : 620.1/127
• Subject Headings:
  • LCSH : Materials -- Microscopy
  • LCSH : Electron microscopy -- Industrial applications