{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA12311828.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA12311828#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA12311828.json"},"dc:title":[{"@value":"Structured logic testing"}],"dc:creator":"Edward B. Eichelberger ... [et al.]","dc:publisher":[{"@value":"Prentice Hall"}],"dcterms:extent":"xvii, 183 p.","cinii:size":"24 cm","dc:language":"eng","dc:date":"1991","cinii:ncid":"BA12311828","cinii:ownerCount":"9","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA05440430#entity","@type":"foaf:Person","foaf:name":[{"@value":"Eichelberger, Edward B."}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA001754","@type":"foaf:Organization","foaf:name":"千葉大学 附属図書館","rdfs:seeAlso":{"@id":"http://opac.ll.chiba-u.jp/opac/opac_openurl/?ncid=BA12311828"}},{"@id":"https://ci.nii.ac.jp/library/FA022743","@type":"foaf:Organization","foaf:name":"京都大学 大学院 情報学研究科","rdfs:seeAlso":{"@id":"https://kuline.kulib.kyoto-u.ac.jp/opac/opac_openurl/?ncid=BA12311828"}},{"@id":"https://ci.nii.ac.jp/library/FA002870","@type":"foaf:Organization","foaf:name":"大阪大学 附属図書館 理工学図書館","rdfs:seeAlso":{"@id":"https://opac.library.osaka-u.ac.jp/opac/opac_openurl/?ncid=BA12311828"}},{"@id":"https://ci.nii.ac.jp/library/FA003170","@type":"foaf:Organization","foaf:name":"岡山大学 図書館","rdfs:seeAlso":{"@id":"http://webcat.lib.okayama-u.ac.jp/mylimedio/search/search.do?ncid=BA12311828"}},{"@id":"https://ci.nii.ac.jp/library/FA006678","@type":"foaf:Organization","foaf:name":"明治大学 図書館","rdfs:seeAlso":{"@id":"https://opac2018.lib.meiji.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BA12311828"}},{"@id":"https://ci.nii.ac.jp/library/FA006838","@type":"foaf:Organization","foaf:name":"神奈川工科大学 附属図書館","rdfs:seeAlso":{"@id":"https://opac.std.cloud.iliswave.jp/iwjs0013opc/ufirdi.do?ufi_target=ctlsrh&ncid=BA12311828"}},{"@id":"https://ci.nii.ac.jp/library/FA007364","@type":"foaf:Organization","foaf:name":"豊田工業大学 総合情報センター"},{"@id":"https://ci.nii.ac.jp/library/FA012218","@type":"foaf:Organization","foaf:name":"京都産業大学 図書館","rdfs:seeAlso":{"@id":"https://ksucat2.kyoto-su.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BA12311828"}},{"@id":"https://ci.nii.ac.jp/library/FA015260","@type":"foaf:Organization","foaf:name":"会津大学 情報センター (附属図書館)","rdfs:seeAlso":{"@id":"https://libopsv.u-aizu.ac.jp/opac/search?target=local&searchmode=complex&autoDetail=true&s_ncid=BA12311828"}}],"bibo:lccn":["90007352"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/90007352"}],"prism:publicationDate":["1991"],"cinii:note":["Includes bibliographical references and index"],"dc:subject":["LCC:TK7868.L6","DC20:621.39/5"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Logic+circuits+--+Testing","dc:title":"Logic circuits -- Testing"},{"@id":"https://ci.nii.ac.jp/books/search?q=Logic+design","dc:title":"Logic design"}],"dcterms:isPartOf":[{"@id":"https://ci.nii.ac.jp/ncid/BA06957402#entity","dc:title":"Prentice Hall series in computer engineering","@type":"bibo:Book"}],"dcterms:hasPart":[{"@id":"urn:isbn:0138536805"}]}]}