Degradation mechanisms in III-V compound semiconductor devices and structures : symposium held April 17-18, 1990, San Francisco, California, U.S.A.

著者

• Swaminathan, V.
• Pearton, S. J.
• Manasreh, Mahmoud Omar
• Materials Research Society

書誌事項

Degradation mechanisms in III-V compound semiconductor devices and structures : symposium held April 17-18, 1990, San Francisco, California, U.S.A.

editors, V. Swaminathan, S.J. Pearton, M.O. Manasreh

（Materials Research Society symposium proceedings, v. 184）

Materials Research Society, c1990

注記

Includes bibliographical references and indexes

詳細情報

• NII書誌ID(NCID): BA1240787X
• ISBN:
  • 1558990739
• LCCN: 90044597
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pittsburgh, Pa.
• ページ数/冊数: xi, 269 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TK7871.85
  • DC20 : 621.381/52
• 件名:
  • LCSH : Semiconductors -- Reliability -- Congresses
  • LCSH : Semiconductors -- Failures -- Congresses
• 親書誌ID:
  • BA00013775