Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.

Author(s)

• Huang, Ting C.
• Cohen, Philip I.
• Eaglesham, David J.
• Materials Research Society

Bibliographic Information

Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.

editors, Ting C. Huang, Philip I. Cohen, David J. Eaglesham

（Materials Research Society symposium proceedings, v. 208）

Materials Research Society, c1991

Note

Includes bibliographical references and indexes

Details

• NCID: BA1240884X
• ISBN:
  • 155899100X
• LCCN: 91010818
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Pittsburgh, Pa.
• Pages/Volumes: xiii, 367 p.
• Size: 24 cm
• Classification:
  • LCC : QC176.84.S93
  • DC20 : 620/.44
• Subject Headings:
  • LCSH : Thin films -- Surfaces -- Congresses
  • LCSH : Thin films -- Optical properties -- Congresses
  • LCSH : Diffraction -- Congresses
• Parent Bibliography ID:
  • BA00013775