Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.

著者

• Huang, Ting C.
• Cohen, Philip I.
• Eaglesham, David J.
• Materials Research Society

書誌事項

Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.

editors, Ting C. Huang, Philip I. Cohen, David J. Eaglesham

（Materials Research Society symposium proceedings, v. 208）

Materials Research Society, c1991

注記

Includes bibliographical references and indexes

詳細情報

• NII書誌ID(NCID): BA1240884X
• ISBN:
  • 155899100X
• LCCN: 91010818
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pittsburgh, Pa.
• ページ数/冊数: xiii, 367 p.
• 大きさ: 24 cm
• 分類:
  • LCC : QC176.84.S93
  • DC20 : 620/.44
• 件名:
  • LCSH : Thin films -- Surfaces -- Congresses
  • LCSH : Thin films -- Optical properties -- Congresses
  • LCSH : Diffraction -- Congresses
• 親書誌ID:
  • BA00013775