Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.

著者

• Huang, Ting C.
• Cohen, Philip I.
• Eaglesham, David J.
• Materials Research Society

書誌事項

Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.

editors, Ting C. Huang, Philip I. Cohen, David J. Eaglesham

（Materials Research Society symposium proceedings, v. 208）

Materials Research Society, c1991

注記

Includes bibliographical references and indexes

内容説明・目次

内容説明

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA1240884X
• ISBN:
  • 155899100X
• LCCN: 91010818
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pittsburgh, Pa.
• ページ数/冊数: xiii, 367 p.
• 大きさ: 24 cm
• 分類:
  • LCC : QC176.84.S93
  • DC20 : 620/.44
• 件名:
  • LCSH : Thin films -- Surfaces -- Congresses
  • LCSH : Thin films -- Optical properties -- Congresses
  • LCSH : Diffraction -- Congresses
• 親書誌ID:
  • BA00013775