Rapid reliability assessment of VLSICs

著者

• Dorey, A. P.

書誌事項

Rapid reliability assessment of VLSICs

A.P. Dorey ... [et al.]

Plenum Press, c1990

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA12410207
• ISBN:
  • 030643492X
• LCCN: 89072202
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: ix, 202 p.
• 大きさ: 26 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.39/5
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing
  • LCSH : Integrated circuits -- Very large scale integration -- Reliability