Characterization of semiconductor materials : principles and methods
Author(s)
Bibliographic Information
Characterization of semiconductor materials : principles and methods
（Materials science and process technology series）
Noyes Publications, c1989-
- v. 1
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Note
Includes bibliographical references
Description and Table of Contents
Description
Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field. Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, Ion/Solid Interactions and more.
Table of Contents
Electrical Characterization of Semiconductor Materials and DevicesSecondary Ion Mass SpectrometryPhotoelectron Spectroscopy: Applications to SemiconductorsIon/Solid Interaction in Surface AnalysisMolecular Characterization of Dielectric Films by Laser Raman SpectroscopyCharacterization of Semiconductors Surfaces by Appearance Potential SpectroscopyReferencesIndex
by "Nielsen BookData"
