Characterization of epitaxial semiconductor films

Author(s)

• Kressel, Henry

Bibliographic Information

Characterization of epitaxial semiconductor films

edited by Henry Kressel

（Methods and phenomena, their applications in science and technology, v. 2）

Elsevier Scientific Pub. Co., 1976

Note

"Published as a special issue of Thin solid films, vol. 31, issues 1 and 2."

Includes bibliographical references

Details

• NCID: BA12738844
• ISBN:
  • 044441438X
• LCCN: 76372967
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Amsterdam ; New York
• Pages/Volumes: xii, 216 p.
• Size: 25 cm
• Classification:
  • LCC : QC176.83
  • DC : 530.4/1
• Subject Headings:
  • LCSH : Thin films
  • LCSH : Epitaxy
  • LCSH : Semiconductors
• Parent Bibliography ID:
  • BA00060458