Testing and diagnosis of analog circuits and systems

Author(s)

• Liu, Ruey-Wen

Bibliographic Information

Testing and diagnosis of analog circuits and systems

edited by Ruey-Wen Liu

Van Nostrand Reinhold, c1991

Note

Includes bibliographical references and index

• NCID: BA12863631
• ISBN:
  • 0442259328
• LCCN: 90045217
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, N.Y.
• Pages/Volumes: xiv, 284 p.
• Size: 24 cm
• Classification:
  • LCC : TK7870
  • DC20 : 621.381
• Subject Headings:
  • LCSH : Analog electronic systems -- Testing