{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA12863631.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA12863631#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA12863631.json"},"dc:title":[{"@value":"Testing and diagnosis of analog circuits and systems"}],"dc:creator":"edited by Ruey-Wen Liu","dc:publisher":[{"@value":"Van Nostrand Reinhold"}],"dcterms:extent":"xiv, 284 p.","cinii:size":"24 cm","dc:language":"eng","dc:date":"1991","cinii:ncid":"BA12863631","cinii:ownerCount":"4","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA05718322#entity","@type":"foaf:Person","foaf:name":[{"@value":"Liu, Ruey-Wen"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA002236","@type":"foaf:Organization","foaf:name":"福井大学 附属図書館","rdfs:seeAlso":{"@id":"https://karin.flib.u-fukui.ac.jp/opac/search?target=local&searchmode=complex&autoDetail=true&s_ncid=BA12863631"}},{"@id":"https://ci.nii.ac.jp/library/FA006339","@type":"foaf:Organization","foaf:name":"日本大学 工学部図書館","rdfs:seeAlso":{"@id":"https://celib.nihon-u.ac.jp/opac/opac_openurl/?ncid=BA12863631"}},{"@id":"https://ci.nii.ac.jp/library/FA006678","@type":"foaf:Organization","foaf:name":"明治大学 図書館","rdfs:seeAlso":{"@id":"https://opac2018.lib.meiji.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BA12863631"}},{"@id":"https://ci.nii.ac.jp/library/FA007841","@type":"foaf:Organization","foaf:name":"大阪工業大学 図書館","rdfs:seeAlso":{"@id":"https:/opac.lib.oit.ac.jp/iwjs0021opc/ctlsrh.do?ncid=BA12863631"}}],"bibo:lccn":["90045217"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/90045217"}],"prism:publicationDate":["c1991"],"cinii:note":["Includes bibliographical references and index"],"dc:subject":["LCC:TK7870","DC20:621.381"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Analog+electronic+systems+--+Testing","dc:title":"Analog electronic systems -- Testing"}],"dcterms:hasPart":[{"@id":"urn:isbn:0442259328"}]}]}