Scanning force microscopy : with applications to electric, magnetic, and atomic forces
Author(s)
Bibliographic Information
Scanning force microscopy : with applications to electric, magnetic, and atomic forces
（Oxford series on optical sciences, 2）（Oxford series in optical and imaging sciences）
Oxford University Press, 1991
- : alk. paper
Available at / 14 libraries
-
Hokkaido University, Library, Graduate School of Science, Faculty of Science and School of Science図書
:alk. paperdc20:502/sa732070225913
-
No Libraries matched.
- Remove all filters.
Note
Includes bibliographical references and index